Imaging Cameras & Sensors – Wavefront Sensors
Ultra-Violet (UV) Wavefront Sensor
The SID4-UV Wavefront Sensor from Phasics offers a groundbreaking approach to high-resolution, single-shot wavefront analysis in the ultraviolet spectral range (190–400 nm). Based on QuadriWave Lateral Shearing Interferometry (QWLSI), the SID4-UV allows scientists and engineers to capture full 2D phase and intensity maps in real-time, with nanometric accuracy, high dynamic range, and robust compatibility with CW and pulsed UV lasers.
This UV wavefront sensor is ideal for optical R&D, beam shaping, adaptive optics, and high-precision alignment tasks in advanced scientific experiments, optical manufacturing, and high-energy laser systems.
Now available in India through United Spectrum Instruments, the SID4-UV empowers innovation in fields such as photolithography, UV spectroscopy, micromachining, and space optics.
Understanding Ultra-Violet (UV) Wavefront Sensor
The SID4-UV Wavefront Sensor is a specialised optical metrology solution optimised for ultraviolet (UV) applications, covering wavelengths typically between 190 – 400 nm. Leveraging Phasics’ patented quadriwave lateral shearing interferometry (QWLSI®) technology, it delivers precise, quantitative phase measurements of UV lasers and optical systems. With high sensitivity, exceptional dynamic range, and robust design, the SID4-UV enables accurate analysis of aberrations, beam quality, and system performance. Compact and alignment-free, it is an essential tool for semiconductor lithography, biomedical research, and advanced photonics applications requiring precision in UV optical metrology.
Technical Specifications
| Parameter | Value |
| Spectral Range | 190–400 nm |
| Sensor Type | QuadriWave Lateral Shearing Interferometer |
| Detector | UV-sensitive CMOS camera |
| Wavefront Accuracy | λ/100 RMS |
| Dynamic Range | ±π rad (up to 10π with phase unwrapping) |
| Acquisition Speed | Single-shot, real-time |
| Spatial Resolution | High-resolution CMOS (pixel-limited) |
| Calibration | Factory calibrated – ready to use |
| Output Parameters | Wavefront, intensity, M², divergence, Zernike terms |
| Interfaces | USB 3.0 / Ethernet, SDK + GUI |
Key Features and Advantages
QWLSI® Technology
Patented interferometry provides accurate, quantitative phase measurements in the UV domain.
UV Spectral Range (190 – 400 nm)
Optimised for precise analysis of UV lasers, optics, and imaging systems.
High Dynamic Range
Captures both strong aberrations and fine optical variations with accuracy.
Real-Time Monitoring
Supports fast acquisition for observing dynamic UV optical processes.
Compact & Alignment-Free Design
Reduces setup complexity, making it easy to integrate into laboratory and industrial benches.
Advanced Data Analysis
Generates wavefront, MTF, and PSF data for comprehensive optical evaluation.
Advantages:
Provides superior accuracy for ultraviolet laser and optical system characterisation
Detects subtle aberrations invisible to conventional interferometry
Enhances system optimisation with real-time measurement feedback
Compact, plug-and-play integration simplifies workflows
Ensures compliance and repeatability in semiconductor and photonics industries
Trusted by research institutions for UV optics testing and laser diagnostics
Reduces downtime with robust, alignment-free operation
Widely used in lithography, microscopy, and high-precision optical studies
Applications Across Industries
Semiconductor & Lithography
Supports accurate UV optical metrology for lithography tools and processes.
Aerospace & Defence
Validates UV laser systems for navigation, targeting, and adaptive optics.
Medical & Biomedical Research
Optimises UV-based microscopy, diagnostics, and biophotonics systems.
Photonics & Laser Development
Characterises UV lasers and optics for beam shaping and system integration.
Research & Development Centres
Equips universities and labs with advanced tools for UV optical studies.
Industrial Quality Control
Provides repeatable testing of UV optics used in inspection and production systems.
The SID4-UV Wavefront Sensor sets a benchmark in ultraviolet optical metrology, combining accuracy, speed, and reliability for advanced scientific and industrial applications.
Why Choose United Spectrum Instruments?
United Spectrum Instruments is the authorised distributor of SID4-UV Wavefront Sensors in India, offering advanced UV optical metrology solutions.
Genuine Phasics SID4-UV systems with full manufacturer warranty
Specialised expertise in semiconductor, photonics, and biomedical applications
Pan-India installation, training, and after-sales service
Application-specific consultation for UV laser and optical systems
Competitive pricing with dependable customer care
With strong expertise in photonics and optical instrumentation, United Spectrum Instruments ensures Indian industries and research organisations access world-class UV wavefront sensing technology for innovation, compliance, and precision.
FAQs
Can the SID4-UV measure pulsed UV lasers like excimer or DPSS?
Yes, the sensor is designed for both CW and pulsed UV laser sources and performs real-time wavefront measurement even for unstable beam types.
Is special alignment needed for operation?
No, the system is factory calibrated. The QWLSI design enables straightforward alignment and robust performance without vibration isolation.
Can it detect large optical aberrations or misalignments?
Yes. With a ±π rad dynamic range (expandable to 10π), it can measure strong wavefront errors and large-scale beam deformations.
How does the SID4-UV integrate with adaptive optics?
The real-time phase feedback and SDK make it compatible with closed-loop AO systems using deformable mirrors or spatial light modulators.
Is the software compatible with automation platforms?
Yes. The system includes a powerful SDK that supports automation and scripting in environments like Python, LabVIEW, and MATLAB.
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Have Any Questions ?
FAQs
Can the SID4-UV measure pulsed UV lasers like excimer or DPSS?
Yes, the sensor is designed for both CW and pulsed UV laser sources and performs real-time wavefront measurement even for unstable beam types.
Is special alignment needed for operation?
No, the system is factory calibrated. The QWLSI design enables straightforward alignment and robust performance without vibration isolation.
Can it detect large optical aberrations or misalignments?
Yes. With a ±π rad dynamic range (expandable to 10π), it can measure strong wavefront errors and large-scale beam deformations.
How does the SID4-UV integrate with adaptive optics?
The real-time phase feedback and SDK make it compatible with closed-loop AO systems using deformable mirrors or spatial light modulators.
Is the software compatible with automation platforms?
Yes. The system includes a powerful SDK that supports automation and scripting in environments like Python, LabVIEW, and MATLAB.
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