Imaging Cameras & Sensors – Wavefront Sensors

Discover high-performance laser systems, infrared imaging, high-speed cameras, and photonics solutions tailored for Automotive, Aerospace, Defence, Research, and Industry 4.0.

Short-Wave Infrared (SWIR) High Resolution Infrared Wavefront Sensor

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Sid4 swir hr wavefront sensor

Precision Metrology in the Short-Wave Infrared Spectrum

In advanced optics and photonics, characterising short-wave infrared (SWIR) sources with nanometric precision is crucial for applications spanning laser diagnostics, defence electro-optics, and adaptive imaging systems. The SID4-SWIR HR by Phasics is engineered to meet these demands with cutting-edge QuadriWave Lateral Shearing Interferometry (QWLSI) technology, offering robust, real-time wavefront and intensity analysis in the 1100–1700 nm range.

As the official distributor of Phasics in India, United Spectrum Instruments brings this high-performance wavefront sensing solution to scientific and industrial users who require accuracy, stability, and flexibility.

The SID4-SWIR HR Wavefront Sensor is a high-resolution optical metrology system optimised for shortwave infrared (SWIR) applications. Covering the 900 – 1700 nm spectral range, it leverages Phasics’ patented quadriwave lateral shearing interferometry (QWLSI®) technology to deliver precise, quantitative phase measurements. Compact and alignment-free, it provides real-time analysis of wavefronts, aberrations, and optical performance in SWIR lasers and imaging systems. With its outstanding dynamic range and adaptability, the SID4-SWIR HR is an essential tool for research labs, semiconductor industries, and defence applications requiring reliable and accurate SWIR optical metrology.

ParameterValue
Spectral Range1100 – 1700 nm
Sensing PrincipleQWLSI (QuadriWave Lateral Shearing Interferometry)
Phase Accuracy< λ/100 RMS
Spatial Resolution~27.6 µm
Phase Sampling182 x 136 (~24,000 points)
Absolute Accuracy~10 nm RMS
Frame RateUp to 60 fps
Real-Time ProcessingUp to 10 Hz at full resolution
InterfaceGigE (Gigabit Ethernet)
Dimensions (WxHxL)62 x 64 x 94 mm³
Weight~450 g

QWLSI® Technology

Patented interferometry enabling high-resolution, quantitative phase measurements in the SWIR spectrum.

SWIR Spectral Range (900 – 1700 nm)

Specifically optimised for shortwave infrared optical systems and laser sources.

High Dynamic Range

Measures both strong aberrations and subtle phase variations with accuracy.

Real-Time Monitoring

Supports fast acquisition for analysing dynamic SWIR optical processes.

Compact & Alignment-Free

Easily integrates into laboratories and industrial environments with minimal setup.

Advanced Data Outputs

Delivers wavefront maps, MTF, and PSF for comprehensive optical analysis.

Advantages:

  • Provides unmatched wavefront sensing accuracy in the SWIR range

  • Detects fine optical defects invisible to conventional interferometry

  • Compact, plug-and-play system simplifies integration into optical benches

  • Enhances laser and imaging system optimisation with real-time feedback

  • Supports advanced R&D in defence, semiconductor, and photonics sectors

  • Ensures compliance and repeatability in industrial quality control

  • Trusted globally by researchers and industries working with SWIR optics

  • Reduces setup time and complexity with robust, alignment-free design

Defence & Security

Supports adaptive optics, imaging system calibration, and SWIR laser diagnostics.

Semiconductor & Photonics

Ensures precision in SWIR photonic device testing and optical component validation.

Aerospace Applications

Monitors SWIR-based optical systems for navigation, communication, and imaging.

Medical & Biomedical Research

Optimises SWIR-based imaging systems for diagnostics and biophotonics research.

Research & Development Centres

Delivers advanced SWIR metrology for universities and labs studying optical systems.

Industrial Quality Control

Provides reliable phase analysis for SWIR optics used in manufacturing and inspection systems.

The SID4-SWIR HR Wavefront Sensor sets a new standard in SWIR optical metrology, combining precision, adaptability, and speed for demanding scientific and industrial applications.

United Spectrum Instruments is the authorised distributor of SID4-SWIR HR Wavefront Sensors in India, delivering cutting-edge optical metrology solutions.

  • Genuine Phasics SID4-SWIR HR systems with full manufacturer warranty

  • Expertise in SWIR optics, lasers, and imaging applications

  • Pan-India training, installation, and after-sales support

  • Application-specific consultation for defence, semiconductor, and photonics sectors

  • Competitive pricing with dependable technical guidance

With proven expertise in photonics and optical metrology, United Spectrum Instruments ensures Indian industries and research centres gain access to advanced SWIR wavefront sensing solutions that enable innovation and precision.

FAQs

 It covers 1100–1700 nm, making it ideal for SWIR laser diagnostics and optical component testing.

 Yes. The SID4-SWIR HR provides single-shot phase and intensity measurement, ideal for pulsed or unstable infrared sources.

 Absolutely. It works with both coherent and incoherent SWIR sources, including broadband and LED-based IR illumination.

Yes. It supports real-time feedback for deformable mirror systems and other AO platforms operating in the SWIR region.

The SID4-SWIR HR offers better spatial resolution, UV/SWIR sensitivity, single-shot acquisition, and compact integration.

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FAQs

 It covers 1100–1700 nm, making it ideal for SWIR laser diagnostics and optical component testing.

 Yes. The SID4-SWIR HR provides single-shot phase and intensity measurement, ideal for pulsed or unstable infrared sources.

 Absolutely. It works with both coherent and incoherent SWIR sources, including broadband and LED-based IR illumination.

Yes. It supports real-time feedback for deformable mirror systems and other AO platforms operating in the SWIR region.

The SID4-SWIR HR offers better spatial resolution, UV/SWIR sensitivity, single-shot acquisition, and compact integration.

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