Imaging Cameras & Sensors – Wavefront Sensors
Short-Wave Infrared (SWIR) High Resolution Infrared Wavefront Sensor
In advanced optics and photonics, characterising short-wave infrared (SWIR) sources with nanometric precision is crucial for applications spanning laser diagnostics, defence electro-optics, and adaptive imaging systems. The SID4-SWIR HR by Phasics is engineered to meet these demands with cutting-edge QuadriWave Lateral Shearing Interferometry (QWLSI) technology, offering robust, real-time wavefront and intensity analysis in the 1100–1700 nm range.
As the official distributor of Phasics in India, United Spectrum Instruments brings this high-performance wavefront sensing solution to scientific and industrial users who require accuracy, stability, and flexibility.
Understanding SID4-SWIR HR Wavefront Sensor
The SID4-SWIR HR Wavefront Sensor is a high-resolution optical metrology system optimised for shortwave infrared (SWIR) applications. Covering the 900 – 1700 nm spectral range, it leverages Phasics’ patented quadriwave lateral shearing interferometry (QWLSI®) technology to deliver precise, quantitative phase measurements. Compact and alignment-free, it provides real-time analysis of wavefronts, aberrations, and optical performance in SWIR lasers and imaging systems. With its outstanding dynamic range and adaptability, the SID4-SWIR HR is an essential tool for research labs, semiconductor industries, and defence applications requiring reliable and accurate SWIR optical metrology.
Technical Specifications
| Parameter | Value |
| Spectral Range | 1100 – 1700 nm |
| Sensing Principle | QWLSI (QuadriWave Lateral Shearing Interferometry) |
| Phase Accuracy | < λ/100 RMS |
| Spatial Resolution | ~27.6 µm |
| Phase Sampling | 182 x 136 (~24,000 points) |
| Absolute Accuracy | ~10 nm RMS |
| Frame Rate | Up to 60 fps |
| Real-Time Processing | Up to 10 Hz at full resolution |
| Interface | GigE (Gigabit Ethernet) |
| Dimensions (WxHxL) | 62 x 64 x 94 mm³ |
| Weight | ~450 g |
Key Features and Advantages
QWLSI® Technology
Patented interferometry enabling high-resolution, quantitative phase measurements in the SWIR spectrum.
SWIR Spectral Range (900 – 1700 nm)
Specifically optimised for shortwave infrared optical systems and laser sources.
High Dynamic Range
Measures both strong aberrations and subtle phase variations with accuracy.
Real-Time Monitoring
Supports fast acquisition for analysing dynamic SWIR optical processes.
Compact & Alignment-Free
Easily integrates into laboratories and industrial environments with minimal setup.
Advanced Data Outputs
Delivers wavefront maps, MTF, and PSF for comprehensive optical analysis.
Advantages:
Provides unmatched wavefront sensing accuracy in the SWIR range
Detects fine optical defects invisible to conventional interferometry
Compact, plug-and-play system simplifies integration into optical benches
Enhances laser and imaging system optimisation with real-time feedback
Supports advanced R&D in defence, semiconductor, and photonics sectors
Ensures compliance and repeatability in industrial quality control
Trusted globally by researchers and industries working with SWIR optics
Reduces setup time and complexity with robust, alignment-free design
Applications Across Industries
Defence & Security
Supports adaptive optics, imaging system calibration, and SWIR laser diagnostics.
Semiconductor & Photonics
Ensures precision in SWIR photonic device testing and optical component validation.
Aerospace Applications
Monitors SWIR-based optical systems for navigation, communication, and imaging.
Medical & Biomedical Research
Optimises SWIR-based imaging systems for diagnostics and biophotonics research.
Research & Development Centres
Delivers advanced SWIR metrology for universities and labs studying optical systems.
Industrial Quality Control
Provides reliable phase analysis for SWIR optics used in manufacturing and inspection systems.
The SID4-SWIR HR Wavefront Sensor sets a new standard in SWIR optical metrology, combining precision, adaptability, and speed for demanding scientific and industrial applications.
Why Choose United Spectrum Instruments?
United Spectrum Instruments is the authorised distributor of SID4-SWIR HR Wavefront Sensors in India, delivering cutting-edge optical metrology solutions.
Genuine Phasics SID4-SWIR HR systems with full manufacturer warranty
Expertise in SWIR optics, lasers, and imaging applications
Pan-India training, installation, and after-sales support
Application-specific consultation for defence, semiconductor, and photonics sectors
Competitive pricing with dependable technical guidance
With proven expertise in photonics and optical metrology, United Spectrum Instruments ensures Indian industries and research centres gain access to advanced SWIR wavefront sensing solutions that enable innovation and precision.
FAQs
What is the wavelength range of the SID4-SWIR HR?
It covers 1100–1700 nm, making it ideal for SWIR laser diagnostics and optical component testing.
Can it capture single-shot data?
Yes. The SID4-SWIR HR provides single-shot phase and intensity measurement, ideal for pulsed or unstable infrared sources.
Does it support incoherent infrared sources?
Absolutely. It works with both coherent and incoherent SWIR sources, including broadband and LED-based IR illumination.
Is it suitable for adaptive optics in the infrared?
Yes. It supports real-time feedback for deformable mirror systems and other AO platforms operating in the SWIR region.
How does it compare to Shack-Hartmann sensors?
The SID4-SWIR HR offers better spatial resolution, UV/SWIR sensitivity, single-shot acquisition, and compact integration.
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FAQs
What is the wavelength range of the SID4-SWIR HR?
It covers 1100–1700 nm, making it ideal for SWIR laser diagnostics and optical component testing.
Can it capture single-shot data?
Yes. The SID4-SWIR HR provides single-shot phase and intensity measurement, ideal for pulsed or unstable infrared sources.
Does it support incoherent infrared sources?
Absolutely. It works with both coherent and incoherent SWIR sources, including broadband and LED-based IR illumination.
Is it suitable for adaptive optics in the infrared?
Yes. It supports real-time feedback for deformable mirror systems and other AO platforms operating in the SWIR region.
How does it compare to Shack-Hartmann sensors?
The SID4-SWIR HR offers better spatial resolution, UV/SWIR sensitivity, single-shot acquisition, and compact integration.

