Imaging Cameras & Sensors – Wavefront Sensors
Extended Short-Wave Infrared (SWIR) Wavefront Sensor
Redefining Wavefront Analysis in the Infrared Spectrum - Precision Wavefront Sensing for Extended SWIR (1100–2450 nm)
The SID4-eSWIR by Phasics represents a breakthrough in infrared wavefront metrology. Tailored for the extended short-wave infrared (eSWIR) band, this high-performance wavefront sensor enables accurate, high-resolution phase and intensity measurements from 1100 to 2450 nm – a spectral range increasingly critical for next-gen photonics systems, remote sensing, and defence technologies.
Exclusively distributed in India by United Spectrum Instruments, the SID4-eSWIR is built for professionals and researchers seeking uncompromised performance in beam diagnostics, optical system alignment, and advanced IR metrology.
Understanding Extended Short-Wave Infrared (SWIR) Wavefront Sensor
The SID4-eSWIR Wavefront Sensor is an advanced optical metrology solution designed for extended shortwave infrared (eSWIR) applications, typically covering 1100 – 2300 nm. Based on Phasics’ patented quadriwave lateral shearing interferometry (QWLSI®) technology, it provides high-resolution, quantitative phase measurements for lasers, optics, and imaging systems in the eSWIR range. Compact, robust, and alignment-free, it delivers exceptional dynamic range and sensitivity, enabling real-time characterisation of complex optical phenomena. The SID4-eSWIR is ideal for semiconductor inspection, defence, aerospace, and photonics industries requiring precision optical metrology in the extended SWIR spectrum.
Technical Specifications
| Parameter | Value |
| Spectral Range | 1100 – 2450 nm |
| Technology | QuadriWave Lateral Shearing Interferometry (QWLSI) |
| Phase Accuracy | < λ/100 rms |
| Phase Resolution | < 1.5 nm RMS |
| Spatial Resolution | ~13.8 µm |
| Sampling Grid | 364 x 273 (Typical) |
| Frame Rate | Up to 60 fps |
| Processing Speed | Up to 10 Hz |
| Interface | Gigabit Ethernet (GigE) |
| Software SDK | Python, C++, MATLAB, LabVIEW |
| Dimensions | 94 x 64 x 64 mm³ |
| Weight | ~450 g |
Key Features and Advantages
QWLSI® Technology
Patented interferometry offering quantitative phase measurements in the eSWIR range.
Extended SWIR Spectral Range (1100 – 2300 nm)
Specially optimised for eSWIR optical systems and laser characterisation.
High Dynamic Range
Accurately captures both large aberrations and fine optical phase variations.
Fast Acquisition Speed
Supports real-time monitoring of dynamic eSWIR optical processes.
Compact & Alignment-Free Design
Simplifies integration into optical benches, research labs, and industrial systems.
Advanced Data Analysis
Generates wavefront, MTF, and PSF maps for comprehensive system evaluation.
Advantages:
Provides precise wavefront sensing across the extended SWIR spectrum
Detects optical defects not visible with conventional interferometry
Real-time phase analysis supports system optimisation and process control
Enhances R&D in photonics, defence, and semiconductor applications
Compact, plug-and-play design reduces setup time and complexity
Ensures repeatability and compliance in industrial quality assurance
Robust design supports continuous use in demanding environments
Trusted solution for advanced scientific research and industrial optics
Applications Across Industries
Defence & Security
Supports calibration and optimisation of eSWIR imaging and surveillance systems.
Semiconductor & Photonics
Enables high-precision inspection of eSWIR optical devices and photonic components.
Aerospace Applications
Validates eSWIR-based imaging, navigation, and communication systems.
Medical & Biomedical Research
Optimises eSWIR imaging for diagnostics, tissue studies, and biophotonics.
Research & Development Centres
Provides universities and labs with advanced metrology tools for eSWIR optical studies.
Industrial Quality Control
Ensures reliable testing and validation of eSWIR optics in manufacturing.
The SID4-eSWIR Wavefront Sensor sets a benchmark in extended SWIR metrology by combining precision, flexibility, and real-time performance for scientific and industrial innovation.
Why Choose United Spectrum Instruments?
United Spectrum Instruments is the authorised distributor of SID4-eSWIR Wavefront Sensors in India, offering expert sales and technical support.
Genuine Phasics SID4-eSWIR systems with full manufacturer warranty
Application-specific expertise in defence, semiconductor, aerospace, and biomedical sectors
Pan-India installation, integration, training, and after-sales service
Seamless integration with advanced photonics and laser systems
Competitive pricing supported by reliable technical expertise
With proven expertise in photonics and optical metrology, United Spectrum Instruments ensures Indian researchers and industries access cutting-edge eSWIR wavefront sensing technology for precision, compliance, and innovation.
FAQs
What makes SID4-eSWIR suitable for extended SWIR applications?
It’s designed to cover the 1100–2450 nm range with ultra-high resolution, making it ideal for eye-safe lasers, IR coatings, telecom systems, and defence optics.
Can it measure both coherent and incoherent SWIR sources?
Yes. Unlike most traditional sensors, the SID4-eSWIR works with both laser and broadband IR sources, enabling broader applications.
How does it compare to standard wavefront sensors?
SID4-eSWIR offers 20x the spatial resolution of many Shack-Hartmann systems, with nanometric precision and real-time single-shot acquisition.
Is the sensor compact enough for OEM or field use?
Absolutely. Its camera-sized footprint (94 x 64 x 64 mm³) allows easy installation into benchtop and portable setups.
Does Phasics provide calibration and support?
Yes. Each sensor is factory-calibrated, and additional calibration utilities are included. United Spectrum Instruments offers local technical support in India.
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FAQs
What makes SID4-eSWIR suitable for extended SWIR applications?
It’s designed to cover the 1100–2450 nm range with ultra-high resolution, making it ideal for eye-safe lasers, IR coatings, telecom systems, and defence optics.
Can it measure both coherent and incoherent SWIR sources?
Yes. Unlike most traditional sensors, the SID4-eSWIR works with both laser and broadband IR sources, enabling broader applications.
How does it compare to standard wavefront sensors?
SID4-eSWIR offers 20x the spatial resolution of many Shack-Hartmann systems, with nanometric precision and real-time single-shot acquisition.
Is the sensor compact enough for OEM or field use?
Absolutely. Its camera-sized footprint (94 x 64 x 64 mm³) allows easy installation into benchtop and portable setups.
Does Phasics provide calibration and support?
Yes. Each sensor is factory-calibrated, and additional calibration utilities are included. United Spectrum Instruments offers local technical support in India.
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