Imaging Cameras & Sensors – Wavefront Sensors
Dualband Infrared Wavefront Sensor (DWIR)
Infrared technologies are shaping the future of defence, aerospace, spectroscopy, and thermal imaging. The SID4-DWIR Wavefront Sensor by Phasics is the industry’s first commercial wavefront sensor specifically engineered for the deep-wave infrared (DWIR) spectral range (3–5 µm). Built on Phasics’ proprietary QuadriWave Lateral Shearing Interferometry (QWLSI) platform, it enables real-time, single-shot phase and intensity measurements with nanometric accuracy, making it an essential tool for IR system developers.
Now available in India via United Spectrum Instruments, the SID4-DWIR is optimised for challenging optical environments, ensuring accurate diagnostics even in systems with strong aberrations or unstable beams.
Understanding Dualband Infrared Wavefront Sensor (DWIR)
The SID4-DWIR Wavefront Sensor is a specialised optical metrology solution designed for dual-wavelength infrared (DWIR) applications. Built on Phasics’ patented quadriwave lateral shearing interferometry (QWLSI®) technology, it enables precise and simultaneous phase measurements across two infrared spectral bands. Compact, robust, and alignment-free, it provides real-time quantitative analysis of optical systems, lasers, and imaging devices in the infrared domain. The SID4-DWIR is ideal for aerospace, defence, semiconductor, and photonics industries where multi-spectral wavefront characterisation is required, offering accuracy, flexibility, and repeatability for advanced optical testing and research applications.
Technical Specifications
| Parameter | Value |
| Spectral Range | 3 – 5 µm |
| Sensor Technology | QuadriWave Lateral Shearing Interferometry |
| Acquisition Mode | Real-time, single-shot |
| Wavefront Accuracy | λ/100 RMS (typical) |
| Dynamic Range | ±π rad (up to 10π with phase unwrapping) |
| Camera Type | Integrated DWIR IR camera |
| Resolution | Depends on detector format (high-res) |
| Software | Phasics GUI + full SDK |
| Outputs | Phase maps, intensity profiles, Zernike, M², beam waist, divergence |
Key Features and Advantages
Dual-Wavelength Infrared Capability
Performs simultaneous wavefront measurements in two distinct IR spectral bands.
QWLSI® Technology
Patented interferometry ensures high-resolution, quantitative phase analysis.
High Dynamic Range
Accurately detects both large aberrations and subtle phase variations across bands.
Real-Time Monitoring
Fast acquisition supports analysis of dynamic infrared optical systems.
Compact & Alignment-Free
Simplifies deployment in laboratories, industrial systems, and adaptive optics benches.
Comprehensive Data Outputs
Delivers wavefront, MTF, and PSF maps for detailed system evaluation.
Advantages:
Provides simultaneous dual-band infrared wavefront characterisation
Enhances system validation for aerospace, defence, and multi-spectral optics
Detects subtle defects across multiple IR bands for deeper insight
Reduces complexity by combining two-band metrology into one sensor
Improves accuracy and efficiency in R&D and industrial QC processes
Compact, robust design integrates seamlessly into research and production setups
Enables real-time optimisation of dual-band laser and imaging systems
Trusted by global research institutions and industries working with multi-spectral IR optics
Applications Across Industries
Defence & Aerospace
Validates multi-spectral IR systems for navigation, targeting, and surveillance.
Semiconductor & Photonics
Supports testing of dual-band IR detectors, optical devices, and photonic systems.
Medical & Biomedical Research
Optimises IR imaging systems for diagnostics and tissue studies across multiple bands.
Industrial Quality Control
Provides accurate, repeatable characterisation of dual-band infrared optics.
Research & Development Centres
Equips universities and labs with advanced tools for dual-band IR optical metrology.
Energy & Remote Sensing
Enhances calibration and validation of infrared systems for environmental monitoring and geoscience.
The SID4-DWIR Wavefront Sensor enables cutting-edge multi-spectral metrology, combining precision, versatility, and real-time feedback for advanced scientific and industrial applications.
Why Choose United Spectrum Instruments?
United Spectrum Instruments is the authorised distributor of SID4-DWIR Wavefront Sensors in India, providing tailored solutions for dual-wavelength infrared optical metrology.
Genuine Phasics SID4-DWIR systems with full manufacturer warranty
Specialised expertise in aerospace, defence, semiconductor, and photonics sectors
Pan-India training, installation, and after-sales technical support
Seamless integration for laboratory, R&D, and industrial applications
Competitive pricing backed by dependable customer service
With extensive experience in photonics and optical metrology, United Spectrum Instruments ensures Indian researchers and industries gain access to world-class DWIR wavefront sensing solutions that drive innovation, compliance, and precision.
FAQs
What laser types are compatible with SID4-DWIR?
It supports CW and pulsed sources in the 3–5 µm range, including CO, QCL, and mid-IR solid-state lasers.
Can I integrate the system into a test bench or IR optical setup?
Yes, it includes mechanical adapters and an SDK for seamless integration into optical benches and automated test environments.
Does the sensor support dynamic beam characterisation?
Yes, single-shot acquisition enables analysis of unstable or pulsed beam sources in real time.
How does it handle large wavefront aberrations?
The system has a high dynamic range and optional phase unwrapping for characterising significantly aberrated wavefronts.
What support is available in India?
United Spectrum Instruments provides full technical and application support, including demos, training, and warranty handling.
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FAQs
What laser types are compatible with SID4-DWIR?
It supports CW and pulsed sources in the 3–5 µm range, including CO, QCL, and mid-IR solid-state lasers.
Can I integrate the system into a test bench or IR optical setup?
Yes, it includes mechanical adapters and an SDK for seamless integration into optical benches and automated test environments.
Does the sensor support dynamic beam characterisation?
Yes, single-shot acquisition enables analysis of unstable or pulsed beam sources in real time.
How does it handle large wavefront aberrations?
The system has a high dynamic range and optional phase unwrapping for characterising significantly aberrated wavefronts.
What support is available in India?
United Spectrum Instruments provides full technical and application support, including demos, training, and warranty handling.
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