A VCSEL characterization and testing system integrates electrical probing, optical signal capture, and data analysis into a single automated platform. VCSEL wafers or individual chips are positioned with nanometre-scale accuracy, while probes and fibres align precisely to each device. The system performs controlled electrical stimulation and captures optical responses, generating detailed performance metrics across temperature and operating conditions. Automated wafer mapping and test recipes allow rapid comparison across devices, making it ideal for process optimisation, binning, and quality control in advanced photonics and semiconductor manufacturing environments.

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Nanometre-Scale Motion and Probing Accuracy

High-resolution stages and precision probes ensure accurate electrical contact and repeatable optical alignment across entire wafers.

Comprehensive Optical and Electrical Characterisation

Supports LIV curves, optical power measurement, wavelength analysis, SMSR evaluation, and voltage-current profiling in a single workflow.

Temperature-Controlled Testing

Programmable chuck temperature enables full thermal characterisation, essential for reliability testing in telecom, automotive, and consumer electronics.

High-Speed and RF Test Capability

Compatible with external RF and network analysers to evaluate modulation bandwidth and small-signal response of high-speed VCSELs.

Machine Vision–Based Alignment

Integrated vision systems provide automated probe and fibre alignment, reducing setup time and operator dependency.

Wafer-Level and Chip-Level Flexibility

Supports full wafers as well as singulated chips, allowing use across R&D, pilot lines, and production environments.

Advanced Data Mapping and Analysis

Colour-coded wafer maps, real-time plotting, and exportable datasets simplify defect identification and yield analysis.

Automation-Ready Architecture

Optional robotic handling and recipe-driven testing enable unattended operation and scalable throughput.

Software-Driven Process Control

Intuitive software manages test sequences, stores device data, and integrates with factory databases or external analysis tools.

Telecom and Datacom VCSEL Manufacturing

Characterisation of VCSEL arrays used in optical interconnects, transceivers, and active optical cables with high repeatability.

3D Sensing and Consumer Electronics

Testing VCSELs for facial recognition, time-of-flight sensing, and AR/VR systems under realistic operating conditions.

Automotive and LiDAR Systems

Thermal and performance validation of VCSELs used in driver monitoring, short-range LiDAR, and in-cabin sensing.

Biomedical and Diagnostic Optics

Low-power and wavelength-stable testing for VCSELs used in imaging, spectroscopy, and medical diagnostics.

Semiconductor Backend and Packaging

Wafer sorting, die binning, and post-assembly validation for hybrid and co-packaged photonic devices.

Research and Academic Laboratories

Flexible platform for developing new VCSEL designs, studying thermal effects, and performing comparative device analysis.

Photonics Prototyping and Pilot Lines

Rapid evaluation of small batches during process development and scale-up phases.

United Spectrum Instruments brings deep expertise in photonics testing and semiconductor characterisation systems to customers across India. We support VCSEL manufacturers and research organisations with application-driven system configuration, on-site installation, training, and long-term service. Our local technical team understands VCSEL fabrication challenges and works closely with users to optimise test workflows, improve yield, and accelerate production readiness. Choosing United Spectrum Instruments means partnering with a reliable distributor committed to precision, performance, and responsive after-sales support.