The NanoTest SiP-Wafer is a specialised characterisation system designed for wafer-level testing of silicon photonics (SiP) devices. It combines optical probing, electrical testing, and precision alignment to validate device performance directly on wafers before dicing and packaging. With sub-micron positioning accuracy, advanced vision systems, and automated workflows, the system ensures fast, reliable, and repeatable results. Supporting comprehensive measurements such as insertion loss, coupling efficiency, IV curves, and high-speed electrical testing, the NanoTest SiP-Wafer accelerates R&D and production workflows. Its modular design makes it equally suitable for research institutions, semiconductor fabs, and photonic device manufacturers.

Please contact us for the technical details : sales@unitedspectrum.in

Wafer-Level Testing

Designed specifically for characterisation of silicon photonics devices at the wafer stage.

Automated Active Alignment

Provides sub-micron accuracy for fibre-to-chip and probe alignment.

Comprehensive Test Suite

Performs optical transmission, insertion loss, coupling efficiency, IV curves, and thermal stability testing.

Programmable Automation

Recipe-driven workflows ensure repeatability and reduce operator intervention.

Vision & Monitoring Systems

Integrated cameras and feedback systems improve reliability and throughput.

Scalable Modular Design

Supports both R&D prototyping and high-volume semiconductor manufacturing.

Advantages:

• Dedicated for silicon photonics wafer-level testing

• Combines optical and electrical characterisation in one platform

• Sub-micron alignment ensures precision and reliability in measurements

• Early detection of defects improves overall yield and reduces costs

• Automated workflows increase throughput and reduce human error

• Modular configuration scales from academic labs to semiconductor fabs

• Comprehensive testing ensures device reliability across telecom and datacom applications

• Trusted by industry leaders in photonics and semiconductor manufacturing

Photonics & Optical Communications

Validates silicon photonics devices for DWDM, optical transceivers, and coherent communication systems.

Semiconductor & Microelectronics

Supports wafer-level testing of PICs and hybrid chips, enabling high-volume manufacturing with reduced defect rates.

Data Centres & Cloud Infrastructure

Ensures that photonics-based interconnects and transceivers meet bandwidth, latency, and power efficiency targets.

Aerospace & Defence

Applied in wafer-level testing of secure communication modules and photonic sensors for mission-critical applications.

Research & Development

Universities and labs use it to characterise prototype silicon photonics wafers, accelerating innovation in next-generation PIC architectures.

Industrial Laser Systems

Supports validation of SiP devices integrated with lasers and modulators for precision manufacturing.

Medical & Biophotonics

Applied in photonics-based biomedical devices, optical sensors, and lab-on-chip testing.

Automotive & EV Industry

Used for wafer-level validation of PICs integrated into LiDAR and optical sensors for autonomous vehicles.

By enabling precise wafer-level validation, the NanoTest SiP-Wafer reduces development costs, improves yield, and accelerates the commercialisation of silicon photonics technologies.

United Spectrum Instruments is the authorised distributor of Nanosystec’s NanoTest SiP-Wafer system in India, delivering advanced wafer-level photonic testing solutions with complete support.

• Genuine NanoTest SiP-Wafer systems with full manufacturer warranty

• Expertise in photonics, semiconductor, and telecommunications industries

• Pan-India installation, training, and after-sales technical support

• Application-specific consultation for both research and production setups

• Competitive pricing with dependable local expertise

With proven knowledge in photonics and semiconductor testing, United Spectrum Instruments ensures Indian industries and research organisations access world-class wafer characterisation systems for precision, yield improvement, and long-term reliability.